The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Sep. 28, 2006
Takeshi Onodera, Kanagawa, JP;
Takeshi Onodera, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
A test device that makes a test of a circuit device including a plurality of modules being substitutable in terms of function for one another, and in which a function change can be made for assignment to each of the modules based on an incoming control signal. The test device includes: a control section that generates the control signal, without changing a function to be assigned to a whole of the modules, to make the function change for assignment to each of the modules at least in a group of the modules; and a determination section that detects whether the circuit device operates differently when the function change is made for assignment to the modules, and based on a detection result, determines whether or not at least the group of the modules includes a defective module.