The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Apr. 07, 2005
Tim Ebringer, Victoria, AT;
Sachiko Yoshihama, Kawasaki, JP;
Seiji Munetoh, Kawasaki, JP;
Hiroshi Maruyama, Tokyo-to, JP;
Tim Ebringer, Victoria, AT;
Sachiko Yoshihama, Kawasaki, JP;
Seiji Munetoh, Kawasaki, JP;
Hiroshi Maruyama, Tokyo-to, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A platform configuration measurement device including: a configuration register; means for executing extension processing in which a predetermined operation is performed on a content of the configuration register by using a given additional value, a hash value is obtained by applying a predetermined hash function to a value obtained by the predetermined operation, and the hash value is set for a new content of the configuration register; and measurement extension means for obtaining measured values, corresponding to predetermined components constituting a platform, by sequentially making predetermined measurement on the predetermined components, and for allowing the means for executing extension processing to execute the extension processing using the measured values as the additional values, random extension means is provided for allowing the means for executing extension processing to execute the extension processing using a random value as the additional value.