The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Jun. 08, 2006
Siegbert Steinlechner, Leonberg, DE;
Axel Wenzler, Leonberg, DE;
Siegbert Steinlechner, Leonberg, DE;
Axel Wenzler, Leonberg, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
The invention relates to a method for unambiguously determining a physical parameter Φ using m phase-measured values αwith 1≦i≦m, whereby the phase-measured values αhave different, integer periodicity values nand an integer periodicity difference (a) with Δn>1 within an unambiguous range E of the physical parameter Φ. A value T with (b) and (c) is calculated based on the phase-measured values αand the periodicity values nthereof, and, within a reduced unambiguous range Ewith (d), a value V is allocated to the value T by allocation according to (e), wherein Tstands for a respective lower limit and Tfor a respective upper limit of T. The allocation intervals between the upper (T) and the lower limits (T) for T, as wells as the distances (f) correspond at least to the periodicity difference Δn. In order to determine the physical parameter Φ, value V is added up with the phase-measured values αin a weighted manner.