The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7751980 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 06, 2010

Filed:

Dec. 22, 2006
Applicants:

Gongrui Yan, Beijing, CN;

Peng Liu, Beijing, CN;

Laurent Jammes, La Defense Cedex, FR;

Inventors:

GongRui Yan, Beijing, CN;

Peng Liu, Beijing, CN;

Laurent Jammes, La Defense Cedex, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 49/00 (2006.01); G01V 1/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of TI formation evaluation is disclosed. The method comprises receiving a plurality of borehole measurements; deriving a correlation between a first TI stiffness parameter and other TI stiffness parameters where the first and other TI stiffness parameters representing mechanical behavior of the TI formation; and computing the first and other TI stiffness parameters based on the borehole measurements and the derived correlation. The method further comprises evaluating TI formation elastic properties based on the computed first and other TI stiffness parameters. The method further comprises assuming that the shear modulus parallel to TI symmetric axis can be approximated from other moduli.


Find Patent Forward Citations

Yan, GongRui. (2010). Method and apparatus for evaluating elastic mechanical properties of a transversely isotropic formation (U.S. Patent No. 7751980). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7751980

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