The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2010

Filed:

Dec. 08, 2006
Applicants:

Thomas P. Moyer, Lagrangeville, NY (US);

Keith Tabakman, Fishkill, NY (US);

Brian M. Trapp, Poughkeepsie, NY (US);

Inventors:

Thomas P. Moyer, Lagrangeville, NY (US);

Keith Tabakman, Fishkill, NY (US);

Brian M. Trapp, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computing system, method, and computer program product facilitates data mining of information, for example image data, relating to a surface of a manufactured product when the manufactured product is processed using a tool relative to which the manufactured product may be randomly oriented. For each manufactured object, data pertaining to the surface is converted into a weight distribution. A rotational axis along which each surface would tend to rotate under the action of gravity with the surface supported at its geometric centroid is determined. The sets of data can then be properly oriented relative to one another for data mining by aligning the rotational axis of each set of data.


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