The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Jul. 31, 2006
Applicants:
Simon Widdowson, Palo Alto, CA (US);
James A. Rowson, Palo Alto, CA (US);
Eamonn O'brien-strain, Palo Alto, CA (US);
Parkesh Reddy, Palo Alto, CA (US);
Inventors:
Simon Widdowson, Palo Alto, CA (US);
James A. Rowson, Palo Alto, CA (US);
Eamonn O'Brien-Strain, Palo Alto, CA (US);
Parkesh Reddy, Palo Alto, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a method of evaluating an image for a dominant line, warped mesh information regarding saliency of the image is received. Displacements of components of the warped mesh information are determined relative to corresponding components in un-warped mesh information. Statistical representations of the displacements are utilized to evaluate the image for a dominant line.