The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2010

Filed:

Mar. 29, 2006
Applicants:

Hong-long Chou, Taipei, TW;

Cheng-yuan Tang, Sanchong, TW;

De-jin Shau, Taichung, TW;

Fu-jen Hsiao, Jhudong Township, Hsinchu County, TW;

Inventors:

Hong-Long Chou, Taipei, TW;

Cheng-Yuan Tang, Sanchong, TW;

De-Jin Shau, Taichung, TW;

Fu-Jen Hsiao, Jhudong Township, Hsinchu County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/36 (2006.01); G06T 15/00 (2006.01); G06T 17/00 (2006.01); G06T 15/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for rapidly building image space relation using plane filtering limitation is provided. The method comprises first getting a plurality of continuous image data taken from different shooting angles. Then, a plurality of feature points of the image data is initialized. Next, a number of feature points of those image data is randomly extracted and compared to determine whether the compared feature points are coplanar or not. When the selected feature points are not coplanar, an epipolar fundamental matrix is calculated according to the selected feature points. On the contrary, when the selected feature points are coplanar, a medium error value for all the feature points is set as a maximum value.


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