The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2010

Filed:

Mar. 29, 2007
Applicants:

Nirmala Ramanujam, Chapel Hill, NC (US);

Lee G. Wilke, Chapel Hill, NC (US);

Inventors:

Nirmala Ramanujam, Chapel Hill, NC (US);

Lee G. Wilke, Chapel Hill, NC (US);

Assignee:

Duke University, Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

The subject matter described herein includes an optical assay system for intraoperative assessment of tumor margins. According to one aspect, the subject matter described herein includes a biological sample containment and illumination apparatus for holding a biological sample for illumination by a plurality of electromagnetic radiation probes. The biological sample containment and illumination apparatus includes a plurality of frame members positioned with respect to each other to form an interior space for receiving a biological sample. At least one of the plurality of frame members includes a plurality of probe receiving locations for receiving a plurality of electromagnetic radiation probes. The probe receiving locations position the probes with respect to the biological sample to allow illumination of plural locations of the biological sample by the probes.


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