The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Mar. 30, 2006
Srinivas Varadarajan, San Diego, CA (US);
Michael Laisne, Encinitas, CA (US);
Raghunath R. Bhattagiri, Bangalore, IN;
Arvid G. Sammuli, Escondido, CA (US);
Srinivas Varadarajan, San Diego, CA (US);
Michael Laisne, Encinitas, CA (US);
Raghunath R. Bhattagiri, Bangalore, IN;
Arvid G. Sammuli, Escondido, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
An integrated circuit that supports testing of multiple pads via a subset of these pads includes at least two sections. Each section has multiple pads and multiple test access circuits coupled to these pads. For each section, one pad is designated as a primary pad and the remaining pads are designated as secondary pads. For each section, the test access circuits couple the secondary pads to the primary pad such that all of the pads in the section can be tested by probing just the primary pad. Each test access circuit may be implemented with a simple switch. A controller generates a set of control signals for the test access circuits in all sections. These control signals enable and disable the test access circuits such that all of the sections can be tested in parallel, and the pads in each section can be tested in a sequential order.