The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2010

Filed:

May. 13, 2009
Applicants:

David Newton, Tualatin, OR (US);

Jon Paulsen, Portland, OR (US);

Barry Klinger, Phoenix, AZ (US);

Shi LI, Beaverton, OR (US);

Spencer Barrett, Beaverton, OR (US);

Jasmine LU, Canby, OR (US);

Kent Robinson, Aloha, OR (US);

Inventors:

David Newton, Tualatin, OR (US);

Jon Paulsen, Portland, OR (US);

Barry Klinger, Phoenix, AZ (US);

Shi Li, Beaverton, OR (US);

Spencer Barrett, Beaverton, OR (US);

Jasmine Lu, Canby, OR (US);

Kent Robinson, Aloha, OR (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electronic testing machine that tests electronic components using test contacts is disclosed. A contact takes a plurality of electrical readings for a component retained in a test plate as the test plate is moved in microsteps. These electrical readings can be used to determine alignment and/or to correct alignment as necessary using an adjustment mechanism.


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