System and method for testing a clock circuit

Abstract

A test circuit determines whether a frequency of an output clock signal of a clock circuit is above an output threshold frequency. An input clock signal of the clock circuit is set to an elevated frequency that is higher than a specified frequency. A first counter counts the number of clock cycles of the input clock signal in a test interval to within a tolerance of the elevated frequency. The tolerance of the elevated frequency is higher than a tolerance of the specified frequency. A second counter counts the number of clock cycles of a feedback clock signal in the test interval. A comparator determines whether the frequency of the output clock signal is above the output threshold frequency based on the number of clock cycles of the input clock signal and the number of clock cycles of the feedback clock signal.