The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2010

Filed:

Jun. 11, 2007
Applicants:

Takashi Shirahata, Tokyo, JP;

Ryota Kohara, Tokyo, JP;

Tetsuo Nakazawa, Tokyo, JP;

Osamu Miyazaki, Tokyo, JP;

Inventors:

Takashi Shirahata, Tokyo, JP;

Ryota Kohara, Tokyo, JP;

Tetsuo Nakazawa, Tokyo, JP;

Osamu Miyazaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A Compton camera device according to the invention includes first means for reading coordinate data of a scattering point of a quantum ray detected by a pre-stage detector for each Compton scattering event, second means for reading coordinate data of a reaching point of the Compton-scattered quantum ray detected by a post-stage detector for each Compton scattering event, and third means for calculating a measurement accuracy of the scattered quantum ray by the first and second means for each Compton scattering event, calculating a statistical quantity of the quantum ray for each calculated measurement accuracy, and outputting the calculated statistical quantity to image reconstruction means.


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