The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2010

Filed:

Feb. 16, 2006
Applicants:

Yuuichirou Ueno, Hitachi, JP;

Kensuke Amemiya, Hitachinaka, JP;

Norihito Yanagita, Hitachi, JP;

Takafumi Ishitsu, Hitachi, JP;

Tomoyuki Seino, Hitachi, JP;

Takashi Matsumoto, Hadano, JP;

Shinobu Irikura, Hadano, JP;

Inventors:

Yuuichirou Ueno, Hitachi, JP;

Kensuke Amemiya, Hitachinaka, JP;

Norihito Yanagita, Hitachi, JP;

Takafumi Ishitsu, Hitachi, JP;

Tomoyuki Seino, Hitachi, JP;

Takashi Matsumoto, Hadano, JP;

Shinobu Irikura, Hadano, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/161 (2006.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A positron emission tomography apparatus installs a plurality of detector units in the circumference of a bed. The detector unit installs a plurality of combined substrates including detectors, analogue ASICs, and a digital ASIC and a voltage adjustment device inside a housing. A partition plate installed inside the housing separates the region inside the housing into a first region installed with the combined substrates and a second region installed with the voltage adjustment device. The partition plate blocks noise generated in the voltage adjustment device so as not to affect γ-ray detection signals outputted from the detectors, thereby preventing the effect of the noise generated in the voltage adjustment device toward γ-ray detection signals and shortening the examination time.


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