The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2010

Filed:

Feb. 25, 2008
Applicant:

Jentaie Shiea, Kaohsiung, TW;

Inventor:

Jentaie Shiea, Kaohsiung, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mass spectrometric method for analyzing a vaporized sample, comprising the steps of: forcing sequentially generated charge-laden liquid drops to move towards a receiving unit of a mass spectrometer along a traveling path; establishing a concentration gradient for a target analyte so as to permit diffusion of the vaporized sample which contains at least one of the target analyte therein along a plurality of diffusing paths; and introducing the target-analyte containing vaporized sample through an inlet such that at least one of said diffusing paths intersects said traveling path so as to enable said at least one target analyte to be occluded in at least one of said charge-laden liquid drops to thereby form at least one corresponding ionized analyte for analysis by the mass spectrometer.


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