The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Jan. 03, 2007
Kaushik Chanda, Fishkill, NY (US);
Lawrence Clevenger, LaGrangeville, NY (US);
Timothy J. Dalton, Ridgefield, CT (US);
Louis L. C. Hsu, Fishkill, NY (US);
Chih-chao Yang, Glenmont, NY (US);
Kaushik Chanda, Fishkill, NY (US);
Lawrence Clevenger, LaGrangeville, NY (US);
Timothy J. Dalton, Ridgefield, CT (US);
Louis L. C. Hsu, Fishkill, NY (US);
Chih-Chao Yang, Glenmont, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of monitoring and testing electro-migration and time dependent dielectric breakdown includes forming an addressable wiring test array, which includes a plurality or horizontally disposed metal wiring and a plurality of segmented, vertically disposed probing wiring, performing a single row continuity/resistance check to determine which row of said metal wiring is open, performing a full serpentine continuity/resistance check, and determining a position of short defects.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile