The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2010

Filed:

Dec. 17, 2007
Applicant:

H. Bruce Land, Iii, Laurel, MD (US);

Inventor:

H. Bruce Land, III, Laurel, MD (US);

Assignee:

The Johns Hopkins University, Baltimore, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/96 (2006.01); G01N 30/02 (2006.01); G01N 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to an enhanced sampling device, herein referred to as an ESD, for enhancing the collection efficiency of the SPME method by enhancing the flow of the analytes onto the sampling fiber. The ESD includes a tubular main body, used for a sampling shroud, which directs a flow of analytes to contact the fiber during collection. One end of the main body is open and faces the sample, allowing analytes to flow into the ESD and contact the fiber. A second piece of tubing branches from the other end of the main body and becomes an outlet port, possibly leading to a pump. The ESD permits more rapid transport and absorption of the analytes to the fiber for collection.


Find Patent Forward Citations

Land, III, H.. (2010). Enhanced sampling device (U.S. Patent No. 7749443). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7749443

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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