The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Dec. 09, 2005
Sebastien Martin, Neuilly sur Seine, FR;
Franck Serval, Saint-Etienne, FR;
Laurent Dorel, Saint Chamond, FR;
Yves Leclercq, L'etang-la-Ville, FR;
Rodolphe Le Riche, Saint-Etienne, FR;
Xavier Bay, Saint Germain Laprade, FR;
Sebastien Martin, Neuilly sur Seine, FR;
Franck Serval, Saint-Etienne, FR;
Laurent Dorel, Saint Chamond, FR;
Yves Leclercq, L'etang-la-Ville, FR;
Rodolphe Le Riche, Saint-Etienne, FR;
Xavier Bay, Saint Germain Laprade, FR;
Siemens VAI Metals Tecnhnologies SAS, Saint-Chamond, FR;
Abstract
A method regulating flatness of a metal strip at a roll housing output including at least one dynamic flatness actuator. A rolling process characterizes flatness of the strip by measuring a quantity D in n points distributed across the strip width, from n measurements of the quantity D. Then, using an action model of flatness regulation and an optimizing method, an overall setpoint including at least one elementary setpoint is determined for the dynamic actuator, such that a calculated flatness residual defect criterion is minimal, and executing the overall setpoint. The action model on the flatness used for determining the overall setpoint includes, for the dynamic actuator, as many submodels as there are points for measuring the quantity D characteristic of flatness, each submodel enabling the effect of the dynamic actuator on the quantity D to be calculated at the corresponding point when a setpoint is applied thereto.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile