The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2010
Filed:
Jan. 05, 2009
Anthony M. Tamasi, Los Gatos, CA (US);
Oren Rubenstein, Sunnyvale, CA (US);
Srihari Vegesna, San Jose, CA (US);
Jue Wu, San Jose, CA (US);
Sean J. Treichler, Mountain View, CA (US);
Anthony M. Tamasi, Los Gatos, CA (US);
Oren Rubenstein, Sunnyvale, CA (US);
Srihari Vegesna, San Jose, CA (US);
Jue Wu, San Jose, CA (US);
Sean J. Treichler, Mountain View, CA (US);
NVIDIA Corporation, Santa Clara, CA (US);
Abstract
A system and method for increasing the yield of integrated circuits containing memory partitions the memory into regions and then independently tests each region to determine which, if any, of the memory regions contain one or more memory failures. The test results are stored for later retrieval. Prior to using the memory, software retrieves the test results and uses only the memory sections that contain no memory failures. A consequence of this approach is that integrated circuits containing memory that would have been discarded for containing memory failures now may be used. This approach also does not significantly impact die area.