The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2010

Filed:

Jul. 06, 2007
Applicants:

Sang-man Byun, Suwon-si, KR;

Sang-cheol Kim, Yongin-si, KR;

Jong-hyoung Lim, Hwaseong-si, KR;

Gwan-pyo Hong, Seocho-gu, KR;

Inventors:

Sang-man Byun, Suwon-si, KR;

Sang-cheol Kim, Yongin-si, KR;

Jong-hyoung Lim, Hwaseong-si, KR;

Gwan-pyo Hong, Seocho-gu, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor memory device and related test method are disclosed. Test data is defined from a group of M test bits selected from either input data or corresponding output data. A parallel bit test is then conducted on the test data. The M test bits include N test bits, where N is less than M, selected on a bit by bit basis from the output data, and L test bits, where N+L=M, selected from the input data. The selection of input data may be made in accordance with a don't care case for selected test data.


Find Patent Forward Citations

Byun, Sang-man. (2010). Semiconductor memory device capable of arbitrarily setting the number of memory cells to be tested and related test method (U.S. Patent No. 7747912). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7747912

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