The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2010
Filed:
Jun. 29, 2006
Dieter Böing, Erlangen, DE;
Gregor Malischnig, Erlangen, DE;
Dieter Böing, Erlangen, DE;
Gregor Malischnig, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method to test a clinical and/or medical-technical system and a method for controlling medical-technical examination workflows in a clinical and/or medical-technical system, medical examination workflows in the appertaining system are simulated. For this purpose, a process workflow plan is selected from a number of process workflow plans dependent on an examination task, each of the process workflow plans including a number of linked process units with which system component of the system are respectively associated. Each process workflow plan also includes an input parameter set, an output parameter set and a transfer function that is dependent on the examination task and/or the associated system component. Respective output parameter values and/or performance data for the individual process units are then determined from a number of input parameter values for the appertaining process units on the basis of the transfer function. Respective output parameter values of a process unit are used as input parameter values for a subsequent process unit within the process workflow plan.