The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2010
Filed:
Dec. 28, 2006
Chih-kuang Chang, Taipei Hsien, TW;
Xiao-chao Sun, Shenzhen, CN;
LI Jiang, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
An exemplary method for edge scan of an image is provided. The method includes: setting parameters of an image edge scan; setting parameters for scanning edges of the workpiece; obtaining an image of the workpiece; processing the image and designating a point in the image; searching a first edge point near the designated point in a clockwise direction, wherein there is at least one point adjacent to the first edge point whose color is different with the color of the first edge point; searching other edge points in the manner of searching the first edge point by utilizing a recursive method; calculating coordinates of initial points and end points of scan lines according to the parameters, and searching scanned points according to the initial points and end points on the image that has not been processed; scanning edges of the image based on the scanned points. A related system is also provided.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile