The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2010
Filed:
Sep. 27, 2006
Applicants:
Takuya Imaoka, Kanagawa, JP;
Kimio Tokuda, Kanagawa, JP;
Hiroshi Nishizawa, Kanagawa, JP;
Inventors:
Assignee:
Panasonic Corporation, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
It is an object of the present invention to provide an imaging device that, even if the optical axis of the multifocal lens has a deviation resulting from its decentered surfaces, can prevent an image from being deteriorated by the low precision lens. The imaging device comprises a solid state image sensor for taking an image of an object to produce an image signal indicative of the image, an aspherical single focus lens, a bifocal lens disposed in front of the solid state image sensor, the bifocal lens having two focal distances, and an aperture diaphragm located just before the bifocal lens.