The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2010
Filed:
Jul. 08, 2004
Joseph Shamir, Haifa, IL;
Nir Karasikov, Haifa, IL;
Joseph Shamir, Haifa, IL;
Nir Karasikov, Haifa, IL;
P.M.L-Particles Monitoring Technologies, Ltd., Emek Ha Yarden, IL;
Abstract
The present invention provides a system and method of particle size and concentration measurement based on providing a focused, synthesized, non-Gaussian laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and using algorithms to map the interaction signals to the particle size and the number of interactions per unit time to the concentration. The particles are fluid borne, airborne, or on a surface and have a size ranging from sub-micron to thousands of microns. In an embodiment of the invention, the focused, synthesized, non-Gaussian laser beam is a dark beam. The measurements can be made using the duration of interaction with a scanning beam, including dark field.