The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2010

Filed:

Sep. 12, 2007
Applicants:

David Walker, Fremont, CA (US);

Nathaniel King, Jr., Morgan Hill, CA (US);

Robert Koupal, San Leandro, CA (US);

Inventors:

David Walker, Fremont, CA (US);

Nathaniel King, Jr., Morgan Hill, CA (US);

Robert Koupal, San Leandro, CA (US);

Assignee:

RF Micro Devices, Inc., Greensboro, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for selecting an optimum VCO from an array of VCOs is disclosed. Each VCO in the array has an output range and a limit. In one embodiment, a search set of VCOs is designated as all VCOs in a system. The limit is compared to a tuning value which corresponds to a desired calibration frequency. The comparison divides the array of VCOs into a searched set and a non-searched set. The process is repeated until the non-searched set comprises only one VCO. In another embodiment, the VCOs are ordered such that there is a middle VCO. A VCO in the middle of the array is selected. The limit of the middle VCO is compared to a tuning limit. Based on the comparison, another VCO is selected. The process repeats N times, where N is the logarithm, base 2, of the total number of VCOs to be searched. at the end of the search, an optimum VCO will be found.


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