The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7746094 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 29, 2010

Filed:

Aug. 14, 2007
Applicants:

Xin-ping Zhang, Shenzhen, CN;

Gui-feng Xie, Shenzhen, CN;

Inventors:

Xin-Ping Zhang, Shenzhen, CN;

Gui-Feng Xie, Shenzhen, CN;

Assignees:

Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A testing system for a power supply () includes a testing chamber (), a control switch, an electrical load (), an AC source (), and a PLC (). The power supply has a voltage choice switch. The testing chamber receives the power supply therein. The testing chamber provides a first or a second ambient temperature and supplies a testing environment for the power supply. The control switch switches the power supply to operate between a standby state and an operational state. The electrical load is connected to the power supply. The AC source is connected to the power supply. The AC source outputs the first voltage or the second voltage to the power supply. The PLC controls switching states of the voltage choice switch and the control switch in a manner such that the power supply selectively operates in one of combined switching states of the voltage choice switch and the control switch.


Find Patent Forward Citations

Zhang, Xin-Ping. (2010). Testing system for power supply (U.S. Patent No. 7746094). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7746094

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