The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2010

Filed:

Aug. 15, 2007
Applicants:

Michael Breit, Munich, DE;

Florian Krug, Munich, DE;

Inventors:

Michael Breit, Munich, DE;

Florian Krug, Munich, DE;

Assignee:

Morpho Detection, Inc., Newark, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique is provided for examining a subject. The technique includes illuminating at least a part of the subject with THz radiation and detecting THz radiation reflected and/or transmitted from the illuminated part and incident upon a detector array by measuring change in capacitance corresponding to the incident THz radiation.


Find Patent Forward Citations

Breit, Michael. (2010). Terahertz detectors for use in terahertz inspection or imaging systems (U.S. Patent No. 7745792). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7745792

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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