The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2010

Filed:

Apr. 08, 2005
Applicants:

Roland D Green, Madison, WI (US);

Steve Smith, Fitchburg, WI (US);

Thomas Albert, Fitchburg, WI (US);

Emile F. Nuwaysir, Madison, WI (US);

Inventors:

Roland D Green, Madison, WI (US);

Steve Smith, Fitchburg, WI (US);

Thomas Albert, Fitchburg, WI (US);

Emile F. Nuwaysir, Madison, WI (US);

Assignee:

Roche Nimblegen, Inc., Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C40B 30/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is an improved method of resequencing DNA using microarrays to rapidly map and identify SNPs, deletions and amplification events present in the genome of an organism. The method is performed by hybridizing a reference and a test genome to two separate arrays with each array exhibiting a specific intensity pattern. The intensity differences between the reference and the test genome arrays are used to produce a mutation map. The mapped differences are resequenced on a set of resequencing arrays to identify specific genetic mutations.


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