The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2010
Filed:
Apr. 01, 2004
Applicants:
Page W. Caufield, New York, NY (US);
Deepak Saxena, New York, NY (US);
Michael C. Alfano, New York, NY (US);
Inventors:
Page W. Caufield, New York, NY (US);
Deepak Saxena, New York, NY (US);
Michael C. Alfano, New York, NY (US);
Assignee:
New York University, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); G01N 33/554 (2006.01); C12N 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a method of surveillance for hazardous materials, e.g., chemical, biological and radiological agents. The method comprises assaying a sample derived from materials collected from a sample domain for the presence of a chemical, biological, or radiological agent. The sample domain comprises at least one collection point from which the materials are collected in a pre-existing operation unrelated to surveillance.