The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2010
Filed:
Jun. 15, 2007
Bobby J. Marsh, Lake Stevens, WA (US);
Kinson D. Vanscotter, Stanwood, WA (US);
Leonard S. Bodziony, Seattle, WA (US);
Gary E. Georgeson, Federal Way, WA (US);
Bobby J. Marsh, Lake Stevens, WA (US);
Kinson D. Vanscotter, Stanwood, WA (US);
Leonard S. Bodziony, Seattle, WA (US);
Gary E. Georgeson, Federal Way, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Systems and methods can automatically inspect a workpiece. Non-destructive inspection sensors are mounted on a frame mounted on a transport device. Position of a first predetermined location of a workpiece is measured with a tracking system. The transport device is moved to position the non-destructive inspection sensors proximate the first predetermined location of a workpiece. A first portion of a workpiece proximate the first predetermined location is non-destructively inspected with the non-destructive inspection sensors. Position of a second predetermined location of a workpiece can be measured with the tracking system. The transport device can be moved to position the non-destructive inspection sensors proximate the second predetermined location of a workpiece, and a second portion of a workpiece proximate the second predetermined location can be non-destructively inspected with the non-destructive inspection sensors. Data can be provided from the sensors to a computing system and analyzed by the computing system.