The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2010
Filed:
Nov. 09, 2004
Joachim Bamberg, Dachau, DE;
Wolf-dieter Feist, Vierkirchen, DE;
Joachim Bamberg, Dachau, DE;
Wolf-Dieter Feist, Vierkirchen, DE;
MTU Aero Engines GmbH, Munich, DE;
Abstract
A method and a device are for testing the detectability of at least one flaw in a component, or for evaluating ultrasonic signals of the flaw. The method provides for an electronic specification of the flaw to be generated, which includes a two-dimensional or three-dimensional point pattern. This specification predefines the number, position, shape, orientation, and dimensions of flaws to be deliberately generated. A test specimen is produced, where for each point of the point pattern, a microcrack is generated at the position of this point. An ultrasonic image of the test specimen is recorded and evaluated. The test specimen may be made out of a material transparent to visible light, e.g., crown glass, optical glass, borosilicate glass, or quartz glass. The microcracks may be produced, using internal laser engraving.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile