The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7743355 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 22, 2010

Filed:

Nov. 19, 2007
Applicants:

Jun Zhou, Poughkeepsie, NY (US);

David J. Hathaway, Underhill Center, VT (US);

Chandramouli Visweswariah, Croton-on-Hudson, NY (US);

Patrick M. Williams, Poughkeepsie, NY (US);

Inventors:

Jun Zhou, Poughkeepsie, NY (US);

David J. Hathaway, Underhill Center, VT (US);

Chandramouli Visweswariah, Croton-on-Hudson, NY (US);

Patrick M. Williams, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method for enhanced efficiency and effectiveness in achieving closure of large, complex, high-performance digital integrated circuits. Circuit macros are re-optimized and re-tuned in the timing closure loop by means of a reformulated objective function that allows the optimizer to improve the slack of all signals rather than just the most critical one(s). The incentive to improve the timing of a sub-critical signal is a diminishing function of the criticality of the signal. Thus all signals are improved during the optimization, with the highest incentive to improve on the most critical signals, leading to faster and more effective overall timing closure.


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