The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2010

Filed:

Jan. 26, 2006
Applicants:

Martin Hassner, Mountain View, CA (US);

Kirk Hwang, Palo Alto, CA (US);

Inventors:

Martin Hassner, Mountain View, CA (US);

Kirk Hwang, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A combined encoder/syndrome generator is provided that has a reduced delay. The combined encoder/syndrome generator generates check symbols during an encoding process and error syndromes during a decoding process. The combined encoder/syndrome generator has two or more blocks. The output of each block is fed as an input into a subsequent block. Each block can perform computations in parallel to reduce the delay of the encoding system.


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