The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Jun. 20, 2006
Minoru Akiyama, Tokyo, JP;
Hideki Takahashi, Chiba, JP;
Akihito Ogawa, Kanagawa, JP;
Chosaku Noda, Kanagawa, JP;
Minoru Akiyama, Tokyo, JP;
Hideki Takahashi, Chiba, JP;
Akihito Ogawa, Kanagawa, JP;
Chosaku Noda, Kanagawa, JP;
NEC Corporation, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
In order to select the latest defect management information, the latest selection information first is selected by searching a plurality of selection information areas for a currently active selection information area in which the latest selection information is recorded and subsequently the latest defect management information is obtained by searching a plurality of defect management areas for a currently active defect management area in which the latest defect management information is recorded. If there is no unused defect management area in which defect management information can be alternatively recorded in lieu of the currently active defect management area, recording operation is limited.