The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Apr. 28, 2005
Gantcho Lubenov Vatchkov, Takamatsu, JP;
Koji Komatsu, Takamatsu, JP;
Satoshi Fujii, Tokyo, JP;
Isao Murota, Tokyo, JP;
Gantcho Lubenov Vatchkov, Takamatsu, JP;
Koji Komatsu, Takamatsu, JP;
Satoshi Fujii, Tokyo, JP;
Isao Murota, Tokyo, JP;
Shin Caterpillar Mitsubishi Ltd., Tokyo, JP;
Abstract
A method and apparatus that detects a multiplicity of normal data sets, each of which includes values of n parameters, for each of the operation modes of an object having a plurality of operation modes. Self-organizing maps are provided for each operation mode using the normal data sets. Abnormal data sets representing virtual abnormal states are created by modifying the values of the n parameters of each of the multiple normal data sets so that as many abnormal data sets as the number of deviation vectors are created for each of the multiple normal data sets. Abnormal operation mode proportion vectors are then created by selecting a self-organizing map from the above noted self-organizing maps which has the highest similarity degree to each of the abnormal data sets.