The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Feb. 12, 2008
Charles J. Lemont, Jr., Commerce Township, MI (US);
Jose M. Lopez, Brighton, MI (US);
David C. Pomerville, Brighton, MI (US);
Scott R. Kloess, Rochester Hills, MI (US);
Robert S. Brines, White Lake, MI (US);
Marc J. Tahnoose, West Bloomfield, MI (US);
Darrin S. Mallard, Oxford, MI (US);
Charles J. Lemont, Jr., Commerce Township, MI (US);
Jose M. Lopez, Brighton, MI (US);
David C. Pomerville, Brighton, MI (US);
Scott R. Kloess, Rochester Hills, MI (US);
Robert S. Brines, White Lake, MI (US);
Marc J. Tahnoose, West Bloomfield, MI (US);
Darrin S. Mallard, Oxford, MI (US);
GM Global Technology Operations, Inc., Detroit, MI (US);
Abstract
A method of determining steering rack rattle propensity of a rack and pinion steering assembly may comprise: simultaneously recording audio, and measuring acceleration of a rack, and right and left side tie-rod end loads; identifying rack rattle events from the audio recording; determining common characteristics of the measured rack acceleration and tie-rod end loads during the identified rack rattle events; creating a rack rattle index level; applying a predetermined force profile to a test rack and pinion steering assembly; measuring a test acceleration on the test rack and pinion steering assembly; calculating a test RMS level in a test frequency range using a test time constant; determining a rack rattle index value from the calculated test RMS level; and comparing the rack rattle index value to the rack rattle index level.