The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Jan. 25, 2007
Tajinder Manku, Waterloo, CA;
Abdellatif Bellaouar, Richardson, TX (US);
Alan Holden, McKinney, TX (US);
Hamid R. Safiri, Dallas, TX (US);
Tajinder Manku, Waterloo, CA;
Abdellatif Bellaouar, Richardson, TX (US);
Alan Holden, McKinney, TX (US);
Hamid R. Safiri, Dallas, TX (US);
Icera Canada ULC, Calgary, CA;
Abstract
An integrated automatic IIP2 calibration architecture for wireless transceivers is disclosed. The architecture enables a wireless transceiver to generate a test radio frequency (RF) signal having a second order tone with minimal additional circuitry. In particular, the test RF signal is generated using a combination of native transceiver circuits and test adaptor circuits. Native transceiver circuits are those circuits implemented on the transceiver chip for executing native transceiver functions during normal operation, which can be used for generating the test (RF) signal. Test adaptor circuits are added to the transceiver chip, more specifically to the native circuits, for enabling the native circuits to generate the test RF signal in a self-test mode of operation. Circuits for implementing a particular IIP2 minimizing scheme can be included on the transceiver chip for automatic IIP2 calibration during the self-test mode of operation.