The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Mar. 30, 2009
Yoshitaka Yamaguchi, Ashigarakami-gun, JP;
Yoshitaka Yamaguchi, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An entire area of an FPD on which an alignment marker provided in a screen is projected is set in advance as a fixed overlapping area (Cto C) according to the long length imaging area and/or the X-ray source position. When determining a plurality of field-of-view area areas for dividing an imaging area for long length imaging into a plurality of areas and taking images, the field-of-view areas (FOVto FOV) and the FPD positions Pcorresponding to the respective field-of-view areas are determined so that adjacent field-of-view areas overlap each other at the set fixed overlapping area. The X-ray source height, the X-ray irradiation direction, the collimator aperture angle and the FPD position are controlled so as to apply an X-ray only to each of the determined field-of-view areas.