The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Jan. 24, 2007
Christopher Parham, Raleigh, NC (US);
Zhong Zhong, Stony Brook, NY (US);
Etta Pisano, Chapel Hill, NC (US);
Dean Connor, Shirley, NY (US);
Leroy D. Chapman, Saskatoon, CA;
Christopher Parham, Raleigh, NC (US);
Zhong Zhong, Stony Brook, NY (US);
Etta Pisano, Chapel Hill, NC (US);
Dean Connor, Shirley, NY (US);
Leroy D. Chapman, Saskatoon, CA;
The University of North Carolina at Chapel Hill, Chapel Hill, NC (US);
Brookhaven Science Associates, Upton, NY (US);
The University of Saskatchewan, Saskatoon, Saskatchewan, CA;
Abstract
Systems and methods for detecting an image of an object using an X-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include detecting an image of an object. The method can include generating a first X-ray beam having a polychromatic energy distribution. Further, the method can include positioning a single monochromator crystal in a predetermined position to directly intercept the first X-ray beam such that a second X-ray beam having a predetermined energy level is produced. Further, an object can be positioned in the path of the second X-ray beam for transmission of the second X-ray beam through the object and emission from the object as a transmitted X-ray beam. The transmitted X-ray beam can be directed at an angle of incidence upon a crystal analyzer. Further, an image of the object can be detected from a beam diffracted from the analyzer crystal.