The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2010

Filed:

Nov. 13, 2006
Applicants:

Hyug Jin Kwon, Anyang-si, KR;

Jung Sup Kim, Seoul, KR;

Inventors:

Hyug Jin Kwon, Anyang-si, KR;

Jung Sup Kim, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 20/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A recording medium, and a method and apparatus for recording defect management information on the recording medium are disclosed. The method for recording defect management information of a recording medium includes recording a defect entry on the recording medium, wherein the defect entry includes a first field that can identify a defect entry type, a second field recording position information of a defect area within a user data area, and a third field recording position information of a replacement area within a spare area, and recording position information corresponding to the second field and/or the third field in accordance with the defect entry type decided by the first field, wherein, in case of a defect entry type having no corresponding position information, the corresponding field is set to zero (0).


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