The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Jul. 20, 2006
Joerg Bewersdorf, Heidelberg, DE;
Hilmar Gugel, Dossenheim, DE;
Joerg Bewersdorf, Heidelberg, DE;
Hilmar Gugel, Dossenheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4π microscope, standing wave field microscope, or IM, IM, or IM microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.