The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Aug. 21, 2006
Fumitaka Sobue, Toride, JP;
Fumitaka Sobue, Toride, JP;
Canon Kabushiki Kaisha, , JP;
Abstract
Data concerning misalignment of beams is measured and held in an optical scanning apparatus before the optical scanning apparatus is incorporated in an image forming apparatus. The optical scanning apparatus includes a light source for emitting multiple beams, an optical lens for converting the multiple beams to parallel lights and a rotating polygon mirror for rotary-deflecting the multiple beams. Furthermore, the measurement apparatus measures main scanning direction misalignment among the multiple beams on a photosensitive member provided for the image forming apparatus, which has been determined by detecting the multiple beams from the rotating polygon mirror (and an fθ lens). The optical scanning apparatus includes a holding unit for holding the data concerning misalignment. The image forming apparatus in which the optical scanning apparatus is incorporated corrects the misalignment with the use of the data concerning misalignment inputted directly or indirectly from the holding unit.