The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2010

Filed:

Apr. 26, 2007
Applicants:

Jan Lipson, Cupertino, CA (US);

Albert L. Lipson, Cupertino, CA (US);

Robert P. Mcnamara, San Jose, CA (US);

Inventors:

Jan Lipson, Cupertino, CA (US);

Albert L. Lipson, Cupertino, CA (US);

Robert P. McNamara, San Jose, CA (US);

Assignee:

C8 Medisensors Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for enhancing the selectivity for spectroscopic measurements of analytes in a turbid medium is described. In one example, spatial filters are used to select only certain radii from the medium to be imaged. This selection is accomplished by placing an optical obstruction on the surface of the medium or at an image plane of the surface later in the optical imaging system. In one implementation, this is achieved by placing a fiber bundle at an image plane of the collecting optical system and then using a spacer of appropriate size at the center of the fiber bundle to act as a central obstruction.


Find Patent Forward Citations

Loading…