The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2010

Filed:

Nov. 08, 2006
Applicants:

Hisashi Aruga, Fujimi, JP;

Tatsuya Shimoda, Fujimi, JP;

Inventors:

Hisashi Aruga, Fujimi, JP;

Tatsuya Shimoda, Fujimi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

An IJ-system reagent inspection devicethat instructs an ejection device to eject a reagent and reads an inspection result from a detachable DNA chip module. The method is carried out based on inspection information of inputted inspection items to produce and output inspection data along with inputted examinee-identification information and the corresponding inspection items through communication lines. In a control device, the examinee identification information is received from the IJ-system reagent inspection devicealong with the inspection items and the inspection data through the communication lines. The inspection items and the inspection data are recorded in association with the examinee identification information to request a diagnosis based on the inspection data.


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