The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2010

Filed:

Mar. 27, 2006
Applicants:

Yoshiyuki Hatano, Tokyo, JP;

Kenichi Watanabe, Tokyo, JP;

Takeshi Nakamura, Tokyo, JP;

Takumi Uchiyama, Tokyo, JP;

Yasuhiko Kusaka, Tokyo, JP;

Inventors:

Yoshiyuki Hatano, Tokyo, JP;

Kenichi Watanabe, Tokyo, JP;

Takeshi Nakamura, Tokyo, JP;

Takumi Uchiyama, Tokyo, JP;

Yasuhiko Kusaka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for processing a chamfering of an eyeglass lens, including means for inputting a width of the chamfering and a range of the chamfering from a periphery of a lens shape at at least one position adjacent to a nose or far away from the nose, arithmetic control means for obtaining a trace for the chamfering on a refractive surface of the eyeglass lens and obtaining the position of the edge end of the eyeglass lens after the processing of the chamfering, and means for displaying the trace of the chamfering by overlapping the lens shape.


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