The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Apr. 15, 2004
Applicants:
Yoshiyuki Hatano, Tokyo, JP;
Kenichi Watanabe, Tokyo, JP;
Takeshi Nakamura, Tokyo, JP;
Takumi Uchiyama, Tokyo, JP;
Yasuhiko Kusaka, Tokyo, JP;
Inventors:
Yoshiyuki Hatano, Tokyo, JP;
Kenichi Watanabe, Tokyo, JP;
Takeshi Nakamura, Tokyo, JP;
Takumi Uchiyama, Tokyo, JP;
Yasuhiko Kusaka, Tokyo, JP;
Assignee:
Kabushiki Kaisha TOPCON, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for processing a chamfering of an eyeglass lens, including the steps of inputting a width of the chamfering and a range of the chamfering from a periphery of a lens shape at a position adjacent to a nose and/or a position far away form the nose, obtaining a trace of the chamfering on a refractive surface of the eyeglass lens and displaying the trace of the chamfering by overlapping the lens shape.