The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Jun. 15, 2007
Wenli Zhu, Beijing, CN;
Yantao LI, Beijing, CN;
Qiang Wang, Beijing, CN;
Haidong Zhang, Beijing, CN;
Bing Sun, Beijing, CN;
Shuguang YE, Beijing, CN;
Min Wang, Beijing, CN;
Jian Wang, Beijing, CN;
Wenli Zhu, Beijing, CN;
Yantao Li, Beijing, CN;
Qiang Wang, Beijing, CN;
Haidong Zhang, Beijing, CN;
Bing Sun, Beijing, CN;
Shuguang Ye, Beijing, CN;
Min Wang, Beijing, CN;
Jian Wang, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
Described is a technology by which software instrumentation data collected from user program sessions are analyzed, including by determining program usage metrics and/or command usage metrics. Information representative of the program usage metrics and/or the command usage metrics is output, such as in the form of a report. The software instrumentation data may be further analyzed, such as to determine at least one usage trend over time, and to determine user groups. For example, a usage subset of sessions that meet specified session usage criteria based on a set of session data may be located, along with a subset of users based on users whose sessions meet specified user criteria. The usage and user subsets may be combined via Boolean logic to produce a result set.