The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Dec. 12, 2005
Martin H. Van Den Berg, Palo Alto, CA (US);
Giovanni L. Thione, San Francisco, CA (US);
Livia Polanyi, Palo Alto, CA (US);
Eleanor G. Rieffel, Mountain View, CA (US);
Patrick Chiu, Menlo Park, CA (US);
Bee Yian Liew, Cupertino, CA (US);
Martin H. Van Den Berg, Palo Alto, CA (US);
Giovanni L. Thione, San Francisco, CA (US);
Livia Polanyi, Palo Alto, CA (US);
Eleanor G. Rieffel, Mountain View, CA (US);
Patrick Chiu, Menlo Park, CA (US);
Bee Yian Liew, Cupertino, CA (US);
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
Techniques are provided for determining relevant information from a document based on document structure. A document is selected and structural elements within the document having a dominance relationship are determined. A first location within the document is selected. The structural element surrounding the first location is determined and the surrounding and non-surrounding structural elements are characterized. Additional documents are associated with the first location in the surrounding structural element based on the surrounding structural element characterization and the non-surrounding structural element characterization. Techniques for dynamically determining annotations for images based on document structure are also provided.