The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Feb. 07, 2007
Josh Loftus, San Jose, CA (US);
Venkat Sundaranatha, San Jose, CA (US);
Louis Marcel Gino Monier, Menlo Park, CA (US);
Jean-michel Leon, Santa Clara, CA (US);
Aditya Arora, Fremont, CA (US);
Benjamin David Foster, Campbell, CA (US);
Seema Shah, San Francisco, CA (US);
Josh Loftus, San Jose, CA (US);
Venkat Sundaranatha, San Jose, CA (US);
Louis Marcel Gino Monier, Menlo Park, CA (US);
Jean-Michel Leon, Santa Clara, CA (US);
Aditya Arora, Fremont, CA (US);
Benjamin David Foster, Campbell, CA (US);
Seema Shah, San Francisco, CA (US);
eBay Inc., San Jose, CA (US);
Abstract
Methods and systems to analyze aspect rules based on domain coverage of aspect-value pairs are provided. The system receives a first plurality of data items from a database, applies a first plurality of rules to the first plurality of data items to generate a second plurality of data items associated with a first domain, counts the second plurality of data items to determine a total quantity of data items, applies a second plurality of rules to the second plurality of data items to identify a third plurality of data items it associates with a first aspect-value pair, counts the third plurality of data items to determine a first quantity of data items, determines a percentage of coverage for the first aspect-value pair based on the first quantity of data items and the total quantity of data items, and provides the percentage coverage for the first aspect-value pair as an interface element within an interface.