The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2010

Filed:

Oct. 01, 2002
Applicants:

Paul G. Greenstein, Croton-on-Hudson, NY (US);

Gregory Leytes, West Milford, NJ (US);

Luu Q. Nguyen, Culver City, CA (US);

Inventors:

Paul G. Greenstein, Croton-on-Hudson, NY (US);

Gregory Leytes, West Milford, NJ (US);

Luu Q. Nguyen, Culver City, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 99/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Measurement data associated with a service element is obtained and analyzed to determine whether one or more aspects of the service element are to be revised. The data collected may be classified as standard, custom, or ad-hoc. Further, the measurement data can be collected for various areas associated with the service element, and may be maintained within a data structure. In one example, collection and analysis of the measurement data are facilitated by a Service Development Tool.


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