The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Apr. 28, 2008
Hendrik F. Hamann, Yorktown Heights, NY (US);
Madhusudan K. Iyengar, Kingston, NY (US);
James A. Lacey, Mahopac, NY (US);
Martin P. O'boyle, Cortlandt Manor, NY (US);
Roger R. Schmidt, Poughkeepsie, NY (US);
Hendrik F. Hamann, Yorktown Heights, NY (US);
Madhusudan K. Iyengar, Kingston, NY (US);
James A. Lacey, Mahopac, NY (US);
Martin P. O'Boyle, Cortlandt Manor, NY (US);
Roger R. Schmidt, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An apparatus and method for measuring the physical quantities of a data center during operation and method for servicing large-scale computing systems is disclosed. The apparatus includes a cart that supports a plurality of sensors. The cart is moveable within the data center. The sensors capture temperature or other physical parameters within the room. The sensor readings, along with position and orientation information pertaining to the cart are transmitted to a computer system where the data is analyzed to select the optimum temperature or other system environmental parameters for the data center.